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ZEISS Innovation Day
Date
06/06/2019
Location
USA / Grand Rapids, MI
Exhibitor
Mark C. Malburg, Ph.D., president of Digital Metrology Solutions, will be providing instruction on surface finish, form & geometry and will also discuss comparison between ISO and ASME standards. Hands-on demonstrations with a ZEISS expert are available. Feel free to bring your own part to be measured.
Learn how metrology can help you do your job and enjoy lunch on us! Attendees will also be entered into a drawing to win a pair of ZEISS binoculars.