Easy-to-use X-ray technology

The new level of simplicity

Inspect the invisible in just one step


With the easy-to-use CT technology of ZEISS METROTOM 1, anyone can efficiently perform complex measurement and inspection tasks with just one scan. Measure and inspect hidden defects and internal structures that cannot be detected with tactile or optical measuring systems. Just as smart: ZEISS METROTOM 1‘s size. With its small footprint, the CT scanner fits easily into your metrology lab and enables inhouse measurements and inspections in just one step.

One CT system, several advantages

ZEISS METROTOM 1 is the ideal device to upgrade your quality inspection portfolio using industrial computed tomography. The CT system boasts with many advantages:

Easy handling

X-Ray easy-to-use

ZEISS METROTOM 1 is built with the user in mind. Installation is a simple process and only little training is needed for being able to use the CT. It just takes one click to start a scanning process!

Precise measurements

Precise X-Ray Technology

Small but thorough: With ZEISS Metrotom 1 you can measure and evaluate complete parts. This allows you to perform accurate nominal/actual comparisons, dimensional checks, and wall thickness analyses with the confidence that you can rely on your measurements.

Small footprint

Compact CT system

ZEISS Metrotom 1 is a compact system with dimensions at 1750 mm (W) x 1820 mm (H) x 870 mm (D). That means the CT system fits into any metrology lab - allowing you to carry out in-house measurements and quality assurance without external measuring services.

Fast return on invest

Fast return on investment

In addition to low acquisition costs, the cost of ownership is also kept to a minimum thanks to the system components: The closed tube of ZEISS METROTOM 1 requires low maintenance just once a year.

ZEISS METROTOM 1 - reliable and compact

Progressive CT technology for every metrology lab

ZEISS is an expert in the field of CT technology and has been providing reliable CT systems as part of the METROTOM family for over a decade. The computed tomography system ZEISS METROTOM 1 now makes reliable X-ray technology and non-destructive quality assurance available to everyone.

Flat panel detector

The X-rays that screen the sample are detected by a flat panel detector.

Rotary table

The rotary table is an essential component during the scanning process to enable capturing of a complete 3D data set of a part.

X-ray tube

X-rays are generated from the X-ray tube and penetrate the sample.

Measure entire components. Guarantee flawless parts.

With ZEISS METROTOM 1, hidden defects of workpieces can be detected with ease in your measuring lab. Whether medium or small sized parts, plastic or light metal - with ZEISS METROTOM 1, you can inspect a variety of parts such as connectors, plastic caps, aluminum parts and more.

GOM Volume Inspect

Comprehensive CT data analysis in 3D

ZEISS METROTOM 1 comes with the operation and inspection software GOM Volume Inspect. The software is suitable for beginners and combines all stages of the CT process from scan set-up and reconstruction to data evaluation and reporting. Geometries, shrinkage holes or internal structures and assembly situations can be evaluated precisely. Even small defects become visible thanks to individual sectional images and can be automatically evaluated using a wide range of criteria. With just one software, you can load volume data from several components into a project, perform a trend analysis, compare the captured 3D data with the CAD model and more.

ZEISS METROTOM 1 with GOM Volume Inspect
ZEISS METROTOM 1 with GOM Volume Inspect

ZEISS Automated Defect Detection (ZADD)

Artificial intelligence in computed tomography

The ZADD add-on in GOM Volume Inspect detects even small and fuzzy defects in components reliably, quickly and automatically, ZADD detects, localizes and classifies defects or anomalies while analyzing them in detail by reading CT-scans. The software add-on is applicable for castings, injection molded parts, batteries printed components and other applications.

Experience how the system works

Technical data

Small and powerful with ZEISS

Fields of application:
Non-destructive inspection, simultaneous scanning of several workpieces

Inspection features:
Measurements of internal and external structures, inspections of internal defects e.g. shrinkage holes.

X-ray source

160 kV

X-ray detector (pixels):

2.5 k (2,500 x 2,500)

Measuring volume

165 x 140 mm

Metrology specification (MPE SD)

5 µm +L/100


1750 mm (W) x 1820 mm (H) x 870 mm (D)


2100 kg


GOM Volume Inspect (included)


32,6 μm

High Resolution Mode

With the High Resolution (HR) mode you can decrease the voxel size of your ZEISS METROTOM 1 system from 65.3 μm to 32.6 μm to better identify defects and to ensure the functionality and quality of your parts.

  • Spot even smaller details and avoid unnoticed defects
  • Improved image quality
  • Easy switch between Standard and High Resolution mode



High Resolution

Voxel size

65.3 μm

32.6 μm

Measuring volume

165 x 140 mm

80 x 80 mm

Pixel size

78 μm x 78 μm

39 μm x 39 μm

View more details and receive a sharper image with the High Resolution mode.

Do you need more information about ZEISS METROTOM 1?

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