ZEISS Microscopy

ZEISS Xradia Context microCT

Your X-ray System for Today with Assurance for Tomorrow

ZEISS Xradia Context is a large field-of-view, non-destructive 3D X-ray micro-computed tomography system. With a robust stage and flexible software-controlled source/detector positioning, you can image large, heavy (25 kg), and tall samples in their full 3D context, as well as small samples with high resolution and detail.


  • Obtain 3D data on entire intact electronic components, large raw materials samples, or biological specimens.
  • Perform non-destructive failure analysis to identify internal defects without cutting your sample or workpiece.
  • Characterize and quantify performance-defining heterogeneities in your materials, like porosity, cracks, inclusions, defects, or multiple phases.
  • Perform multiscale (mm to nm) and multimodal studies by leveraging data together with electron or light microscopy techniques in correlative workflows.
  • Field conversion available to convert your Xradia Context microCT into an industry-leading Xradia Versa X-ray microscope when your needs expand.

Please share your contact details

Our product specialist will contact you at the earliest