Among the most critical artefacts to consider in widefield fluorescence microscopy arises from the fact that regardless of the focal point, illumination from the objective produces fluorescence throughout the entire specimen volume.
Imaging of thick specimens in fluorescence microscopy is compromised by signal originating from regions above and below the focal plane. The result is that sharp image information from the focal plane is overlaid with blurred image information arising from a distant area, reducing the contrast and resolution in the axial (z) dimension. Furthermore, three-dimensional (3D) reconstruction of the specimen is not possible under these conditions.
Aside from using laser confocal technique, this webinar explores how to get better fluorescence images with your widefield microscope through different image post-processing methods as well as by using the structured-illumination technique with Apotome.2
Date: Tuesday, July 21, 2020 10:30 AM - 11:30 AM IST
Speaker: Siang Hui Lim (ZEISS)