High impact scientific research requires innovative technology to address the new and varied challenges in material research characterization facilities. In these facilities, the variety of users and their applications require innovative characterization capabilities that span multiple length scales (i.e cm scale all the way down the nm) and in multiple dimensions (i.e. 2D, 3D and 4D). This presents new requirements on the versatility and flexibility of analytical instrumentation.
In this 45 minute long webinar, we will introduce the ZEISS Xradia Versa X-ray microscope and how it is able to provide a versatile, non-destructive, fast, high resolution and high contrast 3D and 4D material characterization platform.
We will introduce the unique Resolution at a Distance (RaaD) technology and Scout and Zoom technology. This technology was incubated in the synchrotron community, before being made available to core research laboratories in the ZEISS Xradia Versa. This enables none destructive imaging of internal structures and the ability to “zoom” into samples.
This will allow us to explore the unique capabilities this technology provides and its advantages over conventional microCT techniques, to provide a multiscale, fast, versatile, high resolution and high contrast 3D and 4D material characterization platform.
We will then introduce research areas and applications where these capabilities in the ZEISS Xradia Versa are being used:
- Energy Materials & Battery – Microstructure characterization of intact batteries using the Resolution at a Distance (RaaD) capability. This capability removes the requirement for sample preparation. This will include imaging and characterization studies of failure, swelling, and aging effects in the cathode grains and separator layers.
- Metals & alloys – Multiscale non-destructive characterization & diffraction contrast imaging with LabDCT. We will explore 3D and 4D characterization studies looking at deformation, damage and failure. This will include how the RaaD capabilities is able to “zoom in” to view in high resolution fracture initiation points and inclusions in alloys and sintered additive manufacturing samples. We will also describe how the LabDCT capabilities provide a lab based grain mapping capability enabling crystallographic studies using diffraction contrast.
- Composites & Fibers – Imaging, segmentation, quantification and damage analysis of the fibers and structures in fiber based composites. We will explore how the technology in the ZEISS Xradia Versa detection system provide contrast to enable the discrimination of low density inclusions and fibers in similar density polymer matrixes. This will also include example of how machine learning segmentation and software analysis can perform detailed quantitative fiber measurements. Will also explore examples where failure analysis is performed to understand how these materials fail and under what conditions. And finally, examples will be used to highlight applications to understand projectile damage on fiber reinforced materials.
- The final section of this webinar will explore correlation. Materials research characterization often require multiple instruments and therefore the workflow is important. We will introduce example of correlative workflows where 50 nm 3D measurements and also the ZEISS Crossbeam laser can be used to provide a viable correlative workflow across multiple length scales and resolutions.
- ZEISS Xradia Versa – Provides a multiscale, fast, versatile, high resolution and high contrast 3D and 4D material characterization platform.
- The Resolution at a Distance (RaaD) capability provides unique a technology that is able to access unique applications in materials research (particular examples in battery, composites & fibers and metals, alloys and steels).
- Machine learning and quantification – The ZEISS Xradia Versa comes with a range of machine learning based segmentation tools and quantification software protocols for a range of applications.
- Correlative workflows – We have a number of downstream correlative workflows that allow materials researchers to explore their sample.
- Former Nano product development scientist with 13 years of experience in Electron and X-Ray Microscopy.
- Proven track record of providing turnkey microscopy solutions to different R&D groups including academic Institutes, manufacturing & assembly industries and Government organizations.
- Proficient in materials science application and an operational trainer in electron microscopy across the SAARC region.