In this webinar we will outline some of the latest microscopy solutions for battery materials characterization and performance and failure analysis.
This will include low kV and high contrast imaging capabilities for microstructural characterization and how functional electrical properties can be analyzed in the SEM. We will explore microanalysis techniques, outlining the benefits of SIMS, EDS and integrated-RAMAN measurements.
Case studies will be used to illustrate the benefits and non-destructive 3D and 4D analysis in understanding battery performance and failure over time
- Understand the advantages of the Gemini column in providing low kV performance and contrast in battery material characterization
- Understand the range of micro-analysis capabilities and the advantages and disadvantages for Raman, EDS and SIMS
- Understand how the Crossbeam laser and 3D nanotomography can be used to understand battery materials
As battery technology advances, research and development (R&D) teams are trying to understand performance capabilities of newly developed batteries and how these capabilities evolve over time.
In this short presentation, we will outline how the ZEISS Xradia Versa X-ray Microscope (XRM) technology and its unique Resolution at a Distance (RaaD) capability can be applied. We will outline how the technology benefits the Versa provides, enables R&D to be carried out in a safe environment, with intact battery via non-destructive 3D and 4D X-ray microscopy.
Examples will be provided whereby high-resolution 3D scans of intact batteries using the Versa are helping to provide insights into; the calendaring process, polymer separator layering, 4D studies on the evolution of insulating layers around Si particles and the 4D evolution of anode free battery packages.
- Understand how 3D X-ray Microscopy can provide advantages through high-resolution, high-contrast, non-destructive 3D imaging
- Understand how the non-destructive capabilities enable time-based 4D studies to understand battery ageing and failure
- Understand how Electron Beam-Induced Current (EBIC) can be used to provide conductivity mapping to describe functional electrical properties
Section of a lithium ion battery cathode that was extracted from a cycled battery. There are 2 cathode layers on the top and bottom, with a current collector in the middle.
Product - ZEISS Xradia Context microCT
Cross-section image of an uncoated polymer separator membrane from a lithium ion battery imaged at 1kV with the Inlens SE detector..
Product - ZEISS Gemini SEM
Mr. Shaun Graham | Head of Materials Research, Research Microscopy Solutions, ZEISS APAC
Mr. Shaun Graham joined in ZEISS at our Cambridge site in 2013 as a SEM applications specialist. He then moved into Strategic Marketing and Product Development for FE SEM, correlative software and X-ray Microscopy solutions.
Mr. Rajagopal A. | Head of Materials Research, Research Microscopy Solutions, ZEISS India
Mr. Rajagopal joined ZEISS India in 2012. He has 25 years of experience in electron microscopy technology and applications. He is currently responsible for understanding and developing the Materials Research market in India.