ZEISS Microscopy

ZEISS Webinar: X-ray Tomography - An Excellent Technique for characterization in 3D and 4D

June 29, 2021 | Tuesday | 10.30 AM - 11.30 AM IST

Large volume nondestructive 3D crystallographic imaging towards achieving large statistics and true sample representivity


X-ray tomography has become an attractive technique to characterize microstructure in 3D and 4D. In this talk, the principal of X-ray tomography, its advantages over other imaging techniques, processing analysis of reconstructed datasets, examples of use of X-ray tomography for 3D microstructure in different materials and in-situ X-ray tomography will be discussed.


  • Processing and analysis of reconstructed X-ray tomography data
  • Examples of use of X-ray tomography in different materials
  • Use of in-situ X-ray tomography in understanding mechanical behavior
  • The advantages of X-ray tomography over other imaging techniques

X-ray Tomography: An Excellent Technique for characterization in 3D and 4D


Single-phase polycrystalline materials (e.g., steels, alloys, ceramics) do not exhibit any absorption contrast that reveals the underlying grain microstructure. Provides crystallographic information from the diffraction signals of single-phase polycrystalline samples, non-destructively and in three dimensions (3D).Crystal CT/LabDCT upgrade can collect this information.

Now, advancing laboratory X-ray microscopy (XRM) one step further, non-destructive 3D grain mapping Grain Centroid Position which provide Grain Size, Grain Orientation, Grain Shape, Grain Boundary Information.

Today we will present to you in this web seminar the latest capabilities of laboratory-based DCT, including the recently introduced advanced diffraction scanning modes that address the challenge of achieving true sample representivity by seamlessly imaging massive volumes of samples at an unprecedented scale.

Which has application like Heamine studies in pharma, SrTiO3 for solid oxides fuel cells studies,Elecctrical steel for vechicle motors etc.
use cases of large volume grain mapping on a wide variety of materials ranging from metals, ceramics and geomaterials, with further discussions on how this unique laboratory X-ray imaging capability can solve your research problems.


  • ZEISS Xradia CrystalCT is the first commercially available crystallographic imaging microCT system, leading to newer and deeper insights into materials research.
  • DCT for the mass materials scientists - from capability and pricing
  • CrystalCT is the tool bringing synchrotron grain mapping to more labs
    Best in class resolution and image quality. 
  • Two imaging mode: absorption contrast and diffraction contrast imaging.
  • With advanced diffraction scanning modes, laboratory-based DCT frees sample size and geometry limitations – unlocks the characterization challenges for a wide engineering problems.

Application Images

Product - ZEISS Xradia CrystalCT

Product - ZEISS Xradia CrystalCT

Speaker Profiles

Dr. Sudhanshu Shekhar Singh | Assistant Professor, Department of Materials Science and Engineering, IIT Kanpur

Dr. Sudhanshu Shekhar Singh is an assistant professor in the Department of Materials Science and Engineering at IIT Kanpur since 2015. He obtained his PhD from Arizona State University, and his B. Tech degree in Metallurgical and Materials Engineering from IIT Kharagpur in 2008. After his undergraduate studies, he joined Tata Steel, India and worked there for 3 years. The broad area of his research include 3D/4D materials science, mechanical behavior of materials at different length scales and Laser assisted Processing and. He has co-authored over 70 papers in the international peer reviewed journals. He is a recipient of NASI-Young Scientist Platinum Jubilee Awards 2020 by The National Academy of Sciences (India), 2018 SMD JOM Best Paper Award by TMS, Young Metallurgist of the Year Award 2017 by Ministry of Steel & Mines (India) and IEI Young Engineers Award 2017-2018 by The Institution of Engineers (India)

Mr. Rajagopal A. | Head of Materials Research, Research Microscopy Solutions, ZEISS India

Mr. Rajagopal joined ZEISS India in 2012. He has 25 years of experience in electron microscopy technology and applications. He is currently responsible for understanding and developing the Materials Research market in India.

Register for the webinar