ZEISS Technical Cleanliness Analysis solution

This webinar will help you understand the advancements that happened in this topic like:

1. Cleanroom standard measurements – VDA 19.2
2. Need for EDS mapping with the use of SEM – Smart PI
3. Advantages of connected workflow with Zeiss microscopes (Correlative with Optical + Electron microscopes)
4. Classification of particles beyond material composition – Conductive/Non-conductive
5. Automatic Data collation & integration from the contamination extraction bench.
   

• Understand how the on-chip polarization helps in reducing the analysis time.

• Understanding of the international standards for all Components, oil & Cleanroom.

• Root cause analysis – reduces liability.

• Referral case studies / reports