Titanium-Carbide lattice, sample courtesy of Prof. Giorgia Franchin, University of Padua
ON DEMAND WEBINAR

From Microstructural Detail to Engineering Scale: 3D X-ray Imaging for Materials Discovery

See More. Resolve More. Discover More
  • Explore how high-resolution XRM and Industrial CT
  • Visualize internal structures non-destructively
  • Discover how 3D X-ray imaging accelerates materials discovery and innovation
Twisted iron honeycomb, Sample courtesy: Dr. Sammy Shaker, CalTech, USA

ZEISS 3D X-ray Imaging Solutions for Multiscale Material Characterization

Researchers across academia and industry are driving the discovery of advanced materials for next-generation applications. Central to these breakthroughs is the ability to establish structure–property–processing relationships through non-destructive 3D characterization across multiple length scales.

3D X-ray imaging—including high-resolution X-ray microscopy (XRM) and industrial computed tomography (CT)—has emerged as a powerful tool for materials research. XRM enables microscale-to-nanoscale investigation with exceptional resolution and contrast, while industrial CT images larger, representative volumes under real-world conditions. Together, they reveal pores, cracks, inclusions, interfaces, microstructural heterogeneity, damage evolution, and manufacturing defects—and, with in situ and correlative workflows, connect internal structure to performance, processing history, and failure mechanisms.

This webinar highlights how XRM and CT work together to accelerate discovery, with emphasis on the unique capabilities of XRM.

 

3D non-destructive imaging of defects and cracks in nickel based super alloy

High resolution 3D X-ray microscopy enables insights into damage mechanisms of structural materials.
Speaker Dr. Hrishikesh Bale Market Solutions Manager, Engineering Materials Carl Zeiss Research Microscopy Solutions

Dr. Hrishikesh Bale is the Market Solutions Manager managing Engineering Materials at Carl Zeiss Microscopy Inc. He has been working in the area of advanced composites and structural materials for over 20 years. His research focus lies in the area of materials characterization using in-situ micro and nano-mechanical testing using X-ray computed tomography. He has a background in Materials Science and Mechanical Engineering, with over a decade of experience in synchrotron X-ray microscopy, and finds great interest in pushing the boundaries of in-situ imaging under extreme service conditions and developing multimodal nano- and micro-scale 3D imaging solutions.

He also specializes in new application development for laboratory-based 3D X-ray diffraction imaging techniques. Before joining Carl Zeiss Microscopy in 2014, he held a joint postdoctoral position at Lawrence Berkeley National Laboratory and UC Berkeley, working as part of the National Hypersonics Science Center to advance developments of CMC materials for high-temperature applications. He received his Ph.D. in Materials Science from Oklahoma State University in 2010, with a focus on microscale residual stress determination using Synchrotron Laue Microdiffraction techniques. He lives in the San Francisco Bay Area.

Speaker Abhijeet Ranjan Regional Application Manager

Mr. Abhijeet Ranjan is a highly accomplished NDT Expert with 17 years of extensive experience driving Product integrity, quality , and safety compliance across industry segments.


He has mastered both conventional and advanced NDT methodologies. He holds a bachelor degree in Mechanical Engineering and Radiological Safety Officer (RSO) Certification from Bhabha Atomic Research Centre (BARC). He is a certified ASNT Member.  

Register here to watch for the webinar

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